Characterization and Processing Facilities

X-Ray Measurements Labs (Rm 0310C and 1354) 

characterizationfacilities 1
Bruker D8 Thin-Film
X-Ray Measurement
System

 

 characterizationfacilities 2
Siemens D5000
Powder
X-Ray
Diffractometer

 characterizationfacilities 3
Rigaku MiniFlex 600
Six-Sample Powder
X-Ray Diffractometer

characterizationfacilities 4
Mettler Toledo 1600c
TGA/DSC System

 
Deposition Lab (Rm 0219)

thinfilm_TunnelJunctionEvaporator_0219.jpg

Thin Film Tunnel Junction Evaporator

 

thinfilm_SiO2_Chamber_0219 - Copy.jpg

Thin Film SiO2 Chamber

thinfilm_EdwardsEvaporator_0219.jpg

 Edwards Evaporator

  
Deposition Lab (Rm 4303)  thinfilm_ArmySputterer_4303 (Small).jpg

Thin Film Sputterer

 

  thinfilm_TrilayerSputterChamber_4303 (Small).jpg

Thin Film Trilayer Sputterer